Afm, stm and sts studies of grain boundaries And ion-beam induced defects in MGB2

Narayan, Himanshu; Narlikar, A. V.; Herrmann, P. S. P.; Samanta, S. B.; Gupta, Anurag; Kanjilal, D.; Muranaka, T.; Akimitsu, J.; Vijayaraghavan, R.

dc.contributor.author	Narayan, Himanshu
dc.contributor.author	Narlikar, A. V.
dc.contributor.author	Herrmann, P. S. P.
dc.contributor.author	Samanta, S. B.
dc.contributor.author	Gupta, Anurag
dc.contributor.author	Kanjilal, D.
dc.contributor.author	Muranaka, T.
dc.contributor.author	Akimitsu, J.
dc.contributor.author	Vijayaraghavan, R.
dc.date.accessioned	2016-12-05T15:19:03Z
dc.date.available	2016-12-05T15:19:03Z
dc.date.issued	2001-06
dc.identifier.isbn	1-59033-131-1
dc.identifier.uri	http://repository.tml.nul.ls/handle/20.500.14155/806
dc.description	Chapter 25	en_ZA
dc.language.iso	en	en_ZA
dc.publisher	Nova Science Publishers	en_ZA
dc.source	Studies of High Temperature Superconductors Volume 38	en_ZA
dc.title	Afm, stm and sts studies of grain boundaries And ion-beam induced defects in MGB2	en_ZA
dc.type	Book chapter	en_ZA