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Afm, stm and sts studies of grain boundaries And ion-beam induced defects in MGB2

Afm, stm and sts studies of grain boundaries And ion-beam induced defects in MGB2

Narayan, Himanshu; Narlikar, A. V.; Herrmann, P. S. P.; Samanta, S. B.; Gupta, Anurag; Kanjilal, D.; Muranaka, T.; Akimitsu, J.; Vijayaraghavan, R.
URI: http://repository.tml.nul.ls/handle/20.500.14155/806
Date: 2001-06

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Chapter 25

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